Speakers

Plenary speakers

• Andre Vantomme, KU Leuven, Belgium
  "50 years of ion channeling in materials science - where do we go next?"
• Peter Bauer, Johannes Kepler University, Linz, Austria
  "Quantitative Low Energy Ion Scattering - accomplishments and challenges"
• Jiro Matsuo, Kyoto University, Kyoto, Japan
  Secondary Ion Mass Spectrometric Analysis of soft materials - Current challenges and future applications
• Hans Arno Synal, ETH Zurich, Switzerland
  "Progress in Accelerator Mass Spectrometry"
• Marek Rubel, KTH-Royal Institute of Technology, Stockholm, Sweden
  "The role and importance of IBA in studies of wall components in controlled fusion devices"
• Lyudmila Goncharova, The University of Western Ontario, London, Canada
  "High resolution ion depth profiling: beyond high-k materials"

Invited speakers

• Alex Gurbich, IPPE, Obninsk, Russia - "SigmaCalc recent development and present status of the evaluated cross-sections for IBA"
• Timo Sajavaara, University of Jyväskylä, Jyväskylä, Finland – "PIXE using large area transition-edge sensor array"
• Gregor Hlawacek, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany – "Materials analysis using channeling and ionoluminiscence with helium ion microscope"
• Kenji Kimura, Kyoto University, Kyoto, Japan – "Transmission secondary ion mass spectrometry using 5 MeV C60+ ions"
• Udo von Toussaint, Max-Planck-Institut fuer Plasmaphysik, Garching, Germany - "Modern data analysis techniques for ion beam analysis"
• Andrew Bettiol, NUS, Singapore - "Super-resolution imaging with focused MeV ions: Fluorescence and Structural imaging"
• Silvia Nava, INFN, Florence, Italy - "State of the art of IBA analysis of high time resolution aerosol samples"
• Katarina Vogel-Mikuš, University of Ljubljana, Ljubljana, Slovenia - "Complementing X-ray and MS based techniques in studies of trace elements in biological systems"
• Thomas Calligaro, Centre for Research and Restoration of the Museums of France, Paris, France – "Ion beam analysis of light elements in cultural heritage materials"
• Debdulal Kabiraj, Inter University Accelerator Centre, New Delhi, India - "Study on dependence of structural evolution on Se sensitivity of semiconductors by c-RBS"
• Julian Demarche, University of Surrey, Guilford, UK - "Log-periodicity and the epistemic dynamics of Ion Beam Analysis research"
• Denis Jalabert – CEA/INAC, Grenoble, France – "MEIS analysis at the nanoscale, advantages/disadvantages versus X-Rays and TEM"