Venue and Accommodation
Abstracts, Posters, Call for papers
Exhibition and Sponsorship
How to Get There?
Andre Vantomme, KU Leuven, Belgium
"50 years of ion channeling in materials science - where do we go next?"
Peter Bauer, Johannes Kepler University, Linz, Austria
"Quantitative Low Energy Ion Scattering - accomplishments and challenges"
Jiro Matsuo, Kyoto University, Kyoto, Japan
Secondary Ion Mass Spectrometric Analysis of soft materials - Current challenges and future applications
Hans Arno Synal, ETH Zurich, Switzerland
"Progress in Accelerator Mass Spectrometry"
Marek Rubel, KTH-Royal Institute of Technology, Stockholm, Sweden
"The role and importance of IBA in studies of wall components in controlled fusion devices"
Lyudmila Goncharova, The University of Western Ontario, London, Canada
"High resolution ion depth profiling: beyond high-k materials"
Alex Gurbich, IPPE, Obninsk, Russia - "SigmaCalc recent development and present status of the evaluated cross-sections for IBA"
Timo Sajavaara, University of Jyväskylä, Jyväskylä, Finland – "PIXE using large area transition-edge sensor array"
Gregor Hlawacek, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany – "Materials analysis using channeling and ionoluminiscence with helium ion microscope"
Kenji Kimura, Kyoto University, Kyoto, Japan – "Transmission secondary ion mass spectrometry using 5 MeV C60+ ions"
Udo von Toussaint, Max-Planck-Institut fuer Plasmaphysik, Garching, Germany - "Modern data analysis techniques for ion beam analysis"
Andrew Bettiol, NUS, Singapore - "Super-resolution imaging with focused MeV ions: Fluorescence and Structural imaging"
Silvia Nava, INFN, Florence, Italy - "State of the art of IBA analysis of high time resolution aerosol samples"
Katarina Vogel-Mikuš, University of Ljubljana, Ljubljana, Slovenia - "Complementing X-ray and MS based techniques in studies of trace elements in biological systems"
Thomas Calligaro, Centre for Research and Restoration of the Museums of France, Paris, France – "Ion beam analysis of light elements in cultural heritage materials"
Debdulal Kabiraj, Inter University Accelerator Centre, New Delhi, India - "Study on dependence of structural evolution on Se sensitivity of semiconductors by c-RBS"
Julian Demarche, University of Surrey, Guilford, UK - "Log-periodicity and the epistemic dynamics of Ion Beam Analysis research"
Denis Jalabert – CEA/INAC, Grenoble, France – "MEIS analysis at the nanoscale, advantages/disadvantages versus X-Rays and TEM"