Plenary speakers

Invited speakers

  • Alex Gurbich, IPPE, Obninsk, Russia - "SigmaCalc recent development and present status of the evaluated cross-sections for IBA"
  • Timo Sajavaara, University of Jyväskylä, Jyväskylä, Finland – "PIXE using large area transition-edge sensor array"
  • Gregor Hlawacek, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany – "Materials analysis using channeling and ionoluminiscence with helium ion microscope"
  • Kenji Kimura, Kyoto University, Kyoto, Japan – "Transmission secondary ion mass spectrometry using 5 MeV C60+ ions"
  • Udo von Toussaint, Max-Planck-Institut fuer Plasmaphysik, Garching, Germany - "Modern data analysis techniques for ion beam analysis"
  • Andrew Bettiol, NUS, Singapore - "Super-resolution imaging with focused MeV ions: Fluorescence and Structural imaging"
  • Silvia Nava, INFN, Florence, Italy - "State of the art of IBA analysis of high time resolution aerosol samples"
  • Katarina Vogel-Mikuš, University of Ljubljana, Ljubljana, Slovenia - "Complementing X-ray and MS based techniques in studies of trace elements in biological systems"
  • Thomas Calligaro, Centre for Research and Restoration of the Museums of France, Paris, France – "Ion beam analysis of light elements in cultural heritage materials"
  • Debdulal Kabiraj, Inter University Accelerator Centre, New Delhi, India - "Study on dependence of structural evolution on Se sensitivity of semiconductors by c-RBS"
  • Julian Demarche, University of Surrey, Guilford, UK - "Log-periodicity and the epistemic dynamics of Ion Beam Analysis research"
  • Denis Jalabert – CEA/INAC, Grenoble, France – "MEIS analysis at the nanoscale, advantages/disadvantages versus X-Rays and TEM"